1. Andrievskii R.A., Kalinnikov G.V., Kobelev N.P., Soifer Y.M., Shtanskii D.V.
Structure and physicomechanical properties of nanocrystalline boride-nitride films // PHYSICS OF THE SOLID STATE 1997, V. 39, No 10, P. 1661-1666, IF-0.931
2. Andrievskii R.A., Kalinnikov G.V., Shtanskii D.V.
High-resolution transmission and scanning electron microscopy of boride-nitride nanostructured films // PHYSICS OF THE SOLID STATE, 2000, V. 42, No 4, P.760-766, IF-0.931
3. Andrievski R.A., Kalinnikov G.V.
Physical-mechanical and physical-chemical properties of thin nanostructured boride/nitride films // SURFACE & COATINGS TECHNOLOGY, 2001, V. 142, P. 573-578, IF-3.784.
4. Andrievski R.A., Kalinnikov G.V., Jauberteau J., Bates J.
Some peculiarities of fracture of nanocrystalline nitride and boride films // JOURNAL OF MATERIALS SCIENCE, 2000, V. 35, No 11, P. 2799-2806, IF-3.553
5. Andrievski, RA; Dashevsky, ZM; Kalinnikov, GV
Conductivity and the Hall coefficient of nanostructured titanium nitride films // TECHNICAL PHYSICS LETTERS 2004, V.30, No 11, P. 930-932, IF-0.791.
6. Ma K.J, Bloyce A, Andrievski R.A., Kalinnikov G.V.
Microstructural response of mono-and multilayer hard coatings during indentation microhardness testing // SURFACE & COATINGS TECHNOLOGY, 1997, V. 94, No 1-3, P. 322-327, IF-3.784
7. Andrievskii R.A., Kalinnikov G.V., Hellgren N., Sandstrom P., Shtanskii D.V.
Nanoindentation and strain characteristics of nanostructured boride/nitride films // PHYSICS OF THE SOLID STATE, 2000, V. 42, No 9, P. 1671-1674, IF-0.931.
8. Andrievskii R.A., Kalinnikov G.V.
Structure and properties of nanostructured films based on refractory compounds // RUSSIAN CHEMCAL BULLETIN, 2011, V. 60, No 6, P. 1025-1031, IF-1.062.
9. Andrievski R.A., Kalinnikov G.V., Potafeev A.F., Urbanovich V.S.
Synthesis, structure and properties of nanocrystalline nitrides and borides // NANOSTRUCTURED MATERIALS, 1995, V. 6, No 1-4, P. 353-356, IF-0.969
10. Kalinnikov G. V., Andrievski R. A., Kopylov V. N., Louzguine D.
Properties of nanostructured and amorphous films in the TiB2-B4C system // PHYSICS OF THE SOLID STATE, 2008, V. 50, No 2, P. 374-378, IF-0.931
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